Silicon carbide coated silicon nanowires as robust electrode material for aqueous micro-supercapacitor

Applied Physics Letters

Volumn 100, Issue 16, 2012, Pages

  Alper, John P ^a   Vincent, Maxime ^a   Carraro, Carlo ^a   Maboudian, Roya ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Tronics Microsystems   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS ELECTROLYTE; AQUEOUS ENVIRONMENT; CAPACITANCE VALUES; CAPACITIVE BEHAVIOR; CARBON-BASED; CHARGE/DISCHARGE; CHARGE/DISCHARGE CYCLING; CURRENT COLLECTOR; CYCLING STABILITY; ELECTRICAL CONTACTS; ELECTRODE MATERIAL; ENVIRONMENTALLY BENIGN; LOW TEMPERATURES; ON-CHIP APPLICATIONS; PASSIVATION LAYER; PROJECTED AREA; SILICON NANOWIRES; STATE OF THE ART;

ELECTRODES; NANOWIRES; PASSIVATION; SILICON CARBIDE;

ELECTROLYTIC CAPACITORS;

EID: 84859984068     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4704187     Document Type: Article

References (23)

1. N. Tanner, J. R. Wait, C. R. Farrar, and H. Soon, J. Intell. Mater. Syst. Struct. 15, 43 (2003). 10.1177/1045389X03014001005
2. U. Kawoos, G. K. Mugalodi, M. R. Tofighi, S. Neff, and A. Rosen, in Proceedings of 2005 IEEE 31st Annual Northeast Bioengineering Conference, Hoboken, NJ, USA, 2-3 April (IEEE, Piscataway, NJ, USA, 2005), pp. 17-19.
3. T. K. Bhattacharyya, S. Sen, D. Mandal, and S. K. Lahiri, in Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems and Design, Hyderabad, India, 3-7 January (IEEE Computer Society, Los Alamitos, CA, USA, 2006), pp. 4.
4. D. R. Rolison, J. W. Long, J. C. Lytle, A. E. Fischer, C. P. Rhodes, T. M. McEvoy, M. E. Bourga, and A. M. Lubersa, Chem. Soc. Rev. 38, 226 (2009). 10.1039/b801151f
5. P. J. Hall, M. Mirzaeian, S. I. Fletcher, F. B. Sillars, A. R. Rennie, G. O. Shitta-Bey, G. Wilson, A. Cruden, and R. Carter, Energy Environ. Sci. 3, 1238 (2010). 10.1039/c0ee00004c
6. P. Simon and Y. Gogotsi, Philos. Trans. R. Soc. London, Ser. A 368, 3457 (2010). 10.1098/rsta.2010.0109
7. Y. Q. Jiang, Q. Zhou, and L. Lin, in Proceedings of the 2009 IEEE 22nd International Conference on MEMS, Sorrento, Italy, 25-29 January (IEEE, Piscataway, NJ, USA, 2009), pp. 587-590.
8. F. Liu, A. Gutes, I. Laboriante, C. Carraro, and R. Maboudian, Appl. Phys. Lett. 99, 112104 (2011). 10.1063/1.3638468
9. J. Chmiola, C. Largeot, P. L. Taberna, P. Simon, and Y. Gogotsi, Science 328, 480 (2010). 10.1126/science.1184126
10. D. Pech, M. Brunet, P. L. Taberna, P. Simon, N. Fabre, F. Mesnilgrente, V. Condedera, and H. Durou, J. Power Sources 195, 1266 (2010). 10.1016/j.jpowsour.2009.08.085
11. D. Pech, M. Brunet, H. Durou, P. H. Juang, V. Mochalin, Y. Gogotsi, P. L. Taberna, and P. Simon, Nat. Nanotechnol. 5, 651 (2010). 10.1038/nnano.2010.162
12. J. W. Choi, J. McDonough, S. Jeong, J. S. Yoo, C. K. Chan, and Y. Cui, Nano Lett. 10, 1409 (2010). 10.1021/nl100258p
13. K. Peng, Y. Shie, S. Gao, and J. Zhu, Adv. Mater. 14, 1164 (2002). 10.1002/1521-4095(20020816)14:16<1164::AID-ADMA1164>3.0.CO;2-E
14. A. I. Hochbaum, R. Chen, R. D. Delgado, W. Liang, E. C. Garnett, M. Najarian, A. Majumdar, and P. Yang, Nature 451, 163 (2007). 10.1038/nature06381
15. M. Zahedinejad, M. Khaje, A. Erfanian, and F. Raissi, J. Micromech. Microeng. 21, 065006 (2011). 10.1088/0960-1317/21/6/065006
16. B. E. Conway, Electrochemical Supercapacitors: Scientific Fundamentals and Technological Applications (Plenum, New York, NY, USA, 2009), pp. 59-63.
17. F. N. Jing, H. Tong, and C. M. Wang, J. Solid State Electrochem. 8, 877 (2004). 10.1007/s10008-004-0562-5
18. M. Mehregany, C. A. Zorman, N. Rajan, and C. H. Wu, Proc. IEEE 86, 1594 (1998). 10.1109/5.704265
19. C. Roper, V. Radmilovic, C. Carraro, R. T. Howe, and R. Maboudian, J. Electrochem. Soc. 153, C562 (2006). 10.1149/1.2208911
20. M. B. J. Wijesundara, G. Valente, W. R. Ashurst, R. T. Howe, A. P. Pisano, C. Carraro, and R. Maboudian, J. Electrochem. Soc. 151, C210 (2004). 10.1149/1.1646141
21. S. Rohmfeld, M. Hundhausen, and L. Ley. Phys. Rev. B 58, 9858 (1998). 10.1103/PhysRevB.58.9858
22. E. Frackowiak and F. Beguin, Carbon 39, 937 (2001). 10.1016/S0008- 6223(00)00183-4
23. C. Iliescu, B. Chen, J. Wei, and A. J. Pang, Thin Solid Films 516, 5189 (2008). 10.1016/j.tsf.2007.07.013