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Volumn 21, Issue 6, 2011, Pages

Successful definition of nanowire and porous Si regions of different porosity levels by regular positive photoresist using metal-assisted chemical etching

Author keywords

[No Author keywords available]

Indexed keywords

EFFICIENT METHOD; ETCHING TIME; INTEGRATED CIRCUIT FABRICATION; MASKING LAYERS; METAL-ASSISTED CHEMICAL ETCHING; MINIMUM FEATURE SIZES; NANOPATICLES; POROSITY LEVEL; POROUS SI; SELECTIVE FORMATION; SI NANOWIRE; SI WAFER; SILVER NANOPARTICLES; SUBMICRON PATTERNING;

EID: 79957965675     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/21/6/065006     Document Type: Article
Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.