Forced convection during feedback approach curve measurements in scanning electrochemical microscopy: Maximal displacement velocity with a microdisk

Analytical Chemistry

Volumn 84, Issue 8, 2012, Pages 3531-3537

  Cornut, R ^a   Poirier, S ^a   Mauzeroll, Janine ^a  

^a UNIVERSITÉ DU QUÉBEC À MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

APPROACH CURVE; DIFFUSION AND CONVECTION PROCESS; DIFFUSION LIMITED; DISPLACEMENT VELOCITY; ELECTROACTIVE SPECIES; EXPERIMENTAL APPROACHES; FEEDBACK APPROACH; FEEDBACK MODE; FIRST ORDER KINETICS; MEASURED CURRENTS; MEASUREMENT TIME; MICRODISK ELECTRODES; MICRODISKS; MOVING BOUNDARIES; SCANNING ELECTROCHEMICAL MICROSCOPY; STEADY STATE; STEADY-STATE MEASUREMENTS; TRANSIENT MODELING;

ANALYTIC EQUIPMENT; FEEDBACK; MICROELECTRODES; POWER QUALITY; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SOLUTIONS; SUBSTRATES; VELOCITY;

DISPLACEMENT MEASUREMENT;

EID: 84859910662     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac203047d     Document Type: Article

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