Nanoscale magnetic field mapping with a single spin scanning probe magnetometer

Applied Physics Letters

Volumn 100, Issue 15, 2012, Pages

  Rondin, L ^a   Tetienne, J P ^a   Spinicelli, P ^a   Dal Savio, C ^b   Karrai, K ^b   Dantelle, G ^c   Thiaville, A ^d   Rohart, S ^d   Roch, J F ^a   Jacques, V ^a  

^a LABORATOIRE DE PHOTONIQUE QUANTIQUE ET MOLÉCULAIRE   (France)

^b ATTOCUBE SYSTEMS AG   (Germany)

^c LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

^d UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALL-OPTICAL; ATOMIC FORCE MICROSCOPE (AFM); ELECTRON SPINS; LOCK-IN TECHNIQUE; MAGNETIC FIELD MAPPING; MAGNETIC HARD DISKS; MAGNETIC PROBES; NANO SCALE; NANOMAGNETISMS; NANOSCALE RESOLUTIONS; OFF-AXIS; OPERATION RANGE; SCANNING PROBES; SINGLE SPIN; TEST SAMPLES;

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; MAGNETOMETERS; NANOMAGNETICS;

MAGNETIC FIELDS;

EID: 84859799537     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3703128     Document Type: Article

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