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Applied Physics Letters

Volumn 92, Issue 24, 2008, Pages

Scanning magnetic field microscope with a diamond single-spin sensor

(1) Degen, C L a

a IBM ALMADEN RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; DETECTORS; DIAMONDS; ELECTRON SPIN RESONANCE SPECTROSCOPY; IMAGING TECHNIQUES; MAGNETIC DEVICES; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; MAGNETIC MATERIALS; MAGNETIC RESONANCE; MAGNETIC RESONANCE IMAGING; MAGNETISM; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NITROGEN; PARAMAGNETIC RESONANCE; PARAMAGNETISM; PROFILOMETRY; RESONANCE; SENSORS; SPIN DYNAMICS; VACANCIES;

AMERICAN INSTITUTE OF PHYSICS (AIP); ELECTRON PARAMAGNETIC RESONANCE (EPR); LOCAL FIELDS; MAGNETIC (CE); MAGNETIC FIELD MICROSCOPE; MAGNETIC FIELD SENSORS; MAGNETIC NANOSTRUCTURES; NANO CRYSTALS; NANO SCALING; ROOM-TEMPERATURE (RT); SCANNING DEVICES; SINGLE ATOMS; SINGLE SPINS; TRANSITION (JEL CLASSIFICATIONS:E52 ,E41 ,E31); VACANCY DEFECTS;

SCANNING;

EID: 45749141241 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2943282 Document Type: Article

Times cited : (489)

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