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Volumn 22, Issue 10, 2012, Pages 4364-4370

X-ray and neutron reflectivity and electronic properties of PCBM-poly(bromo)styrene blends and bilayers with poly(3-hexylthiophene)

(7) Kirschner, Stuart B a Smith, Nathaniel P a Wepasnick, Kevin A a Katz, Howard E b Kirby, Brian J c Borchers, Julie A c Reich, Daniel H a

a JOHNS HOPKINS UNIVERSITY (United States)

b Johns Hopkins University (United States)

c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; FILM SMOOTHNESS; HEAVY ATOMS; NEUTRON REFLECTIVITY; OSCILLATION AMPLITUDE; POLY (3-HEXYLTHIOPHENE); SCATTERING LENGTH DENSITY; SINGLE LAYER; SMALL CONCENTRATION; STYRENE POLYMERS; UPPER LAYER; UPPER SURFACE; X RAY REFLECTIVITY; X-RAY AND NEUTRON REFLECTIVITY;

ATOMIC FORCE MICROSCOPY; BROMINE; ELECTRON MOBILITY; ELECTRONIC PROPERTIES; PHASE DIAGRAMS; STYRENE; X RAYS;

REFLECTION;

EID: 84859576685 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c2jm14967b Document Type: Article

Times cited : (25)

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