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Volumn 6, Issue 1, 2012, Pages
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Focused ion beam milling of microchannels in lithium niobate
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Author keywords
[No Author keywords available]
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Indexed keywords
FOCUSED ION BEAMS;
IONS;
LITHIUM;
MICROCHANNELS;
MILLING (MACHINING);
NIOBIUM COMPOUNDS;
CROSS SECTIONAL PROFILES;
EXPERIMENTAL MATERIALS;
FOCUSED ION BEAM MILLING;
HIGH ASPECT RATIO;
ION BEAM CURRENTS;
LOW ASPECT RATIO;
MATERIAL REMOVAL RATE;
STOPPING AND RANGE OF IONS IN MATTERS;
ASPECT RATIO;
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EID: 84859367115
PISSN: 19321058
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3673260 Document Type: Article |
Times cited : (18)
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References (37)
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