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Volumn 4, Issue 8, 2012, Pages 2580-2583

Energetics and dynamics of a new type of extended line defects in graphene

(4) Li, Yu a,b,c Zhang, Rui Qin a Lin, Zijing b Van Hove, Michel A a

a CITY UNIVERSITY OF HONG KONG (Hong Kong)

b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

c Suzhou Institute for Advanced Study (China)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC BEHAVIORS; FIRST-PRINCIPLES CALCULATION; FORMATION PROCESS; GROWTH FAULT; HIGH TEMPERATURE; LINE DEFECTS; MOLECULAR DYNAMICS SIMULATIONS;

CALCULATIONS; DEFECTS; ELECTRONIC PROPERTIES; MOLECULAR DYNAMICS;

GRAPHENE;

EID: 84859309096 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c2nr30185g Document Type: Article

Times cited : (15)

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