Dimensional quantification of embedded voids or objects in three dimensions using X-ray tomography

Microscopy and Microanalysis

Volumn 18, Issue 2, 2012, Pages 390-398

  Patterson, Brian M ^a   Escobedo Diaz, Juan P ^a   Dennis Koller, Darcie ^a   Cerreta, Ellen ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

3D quantification; 3D statistics; copper spall; X ray tomography

Indexed keywords

EID: 84859113474     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611012554     Document Type: Article

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