Influence of shock-wave profile shape on dynamically induced damage in high-purity copper

Journal of Applied Physics

Volumn 98, Issue 10, 2005, Pages

  Koller, D D ^a   Hixson, R S ^a   Gray, G T ^a   Rigg, P A ^a   Addessio, L B ^a   Cerreta, E K ^a   Maestas, J D ^a   Yablinsky, C A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

QUASI-ISENTROPIC RAMP WAVES;

COPPER; INTERFEROMETRY; REFLECTION; TENSILE STRESS; VELOCITY MEASUREMENT;

SHOCK WAVES;

EID: 28744441017     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2128493     Document Type: Article

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