Quantitative characterization of the three-dimensional microstructure of polycrystalline Al-Sn using X-ray microtomography

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 35 A, Issue 7, 2004, Pages 1953-1961

  Dobrich K M ^a   Rau, C ^b   Krill III, C E ^c  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b PURDUE UNIVERSITY   (United States)

^c SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; POLYCRYSTALLINE MATERIALS; SEGREGATION (METALLOGRAPHY); TIN; TOMOGRAPHY;

GRAIN BOUNDARY NETWORKS; MICROSTRUCTURAL CHARACTERIZATION; POISSON-VORONOI TESSELLATION; X RAY MICROTOMOGRAPHY;

ALUMINUM ALLOYS;

EID: 3442889382     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-004-0144-2     Document Type: Article

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