3D synchrotron x-ray microtomography of paint samples

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7391, Issue , 2009, Pages

  Ferreira, Ester S B ^a   Boon, Jaap J ^a,b   Van Der Horst, Jerre ^b   Scherrer, Nadim C ^a,c   Marone, Federica ^d   Stampanoni, Marco ^d  

^a Swiss Institute for Art Research (SIK ISEA)   (Switzerland)

^b FOM INSTITUTE AMOLF   (Netherlands)

^c BERN UNIVERSITY OF APPLIED SCIENCES   (Switzerland)

^d PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

3D x Ray imaging; Cuno Amiet; Ground; Paintings; Synchrotron microtomography

Indexed keywords

3D DATA; 3D IMAGING; 3D X-RAY IMAGING; ART RESEARCH; BEAM LINES; BINDING MEDIA; CALCIUM CARBONATE; CHEMICAL DATA; COMPUTING ENVIRONMENTS; CROSS SECTION; CUNO AMIET; DATA SETS; GROUND; GROUND LAYER; MICROFOSSILS; PAINT CHIPS; PARTICLE IDENTIFICATIONS; PAUL SCHERRER INSTITUTE; PIGMENT PARTICLES; SAMPLE SURFACE; SYNCHROTRON MICROTOMOGRAPHY; SYNCHROTRON X-RAY MICROTOMOGRAPHY; TOMOGRAPHIC; X RAY MICROTOMOGRAPHY; X-RAY ENERGIES;

CALCIUM; EXPERIMENTS; HISTORY; PAINT; SYNCHROTRONS; X RAY ANALYSIS; X RAYS;

THREE DIMENSIONAL;

EID: 70350000449     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.827511     Document Type: Conference Paper

References (7)

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