Ultrafast refractometry for characterization of nanocomposite material systems

IEEE Photonics Technology Letters

Volumn 24, Issue 7, 2012, Pages 590-592

  Collier, Christopher M ^a   Jin, Xian ^a   Holzman, Jonathan F ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

Autocorrelation; optical interferometry; refractive index; ultrafast photonics

Indexed keywords

ABSORPTION COEFFICIENTS; INTEGRATED SYSTEMS; OPTICAL CHARACTERISTICS; OPTICAL INTERFEROMETRY; PHASE DELAY; REFRACTOMETRY; REPRESENTATIVE SAMPLE; SIC NANOPARTICLES; SPATIAL COHERENCE; ULTRA-FAST; ULTRA-FAST PHOTONICS; ULTRASHORT LASER;

AUTOCORRELATION; NANOCOMPOSITES; OPTICAL MATERIALS; SILICON CARBIDE;

REFRACTIVE INDEX;

EID: 84858988001     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2012.2184089     Document Type: Article

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