A wide spectral range single-photon avalanche diode fabricated in an advanced 180 nm CMOS technology

Optics Express

Volumn 20, Issue 6, 2012, Pages 5849-5857

  Mandai, Shingo ^a   Fishburn, Matthew W ^a   Maruyama, Yuki ^a   Charbon, Edoardo ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

TIMING JITTER;

ACTIVE AREA; AFTERPULSING; CMOS PROCESSS; CMOS TECHNOLOGY; DARK COUNT RATE; PHOTON DETECTION; SINGLE PHOTON AVALANCHE DIODE; WIDE SPECTRAL RANGE;

CMOS INTEGRATED CIRCUITS;

ARTICLE; AUTOMATED PATTERN RECOGNITION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; PHOTOMETRY; PHOTON; SEMICONDUCTOR;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; PATTERN RECOGNITION, AUTOMATED; PHOTOMETRY; PHOTONS; SEMICONDUCTORS;

EID: 84858981418     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.005849     Document Type: Article

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