A 128x96 pixel event-driven phase-domain ΔΣ-based fully digital 3D camera in 0.13μm CMOS imaging technology

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2011, Pages 410-411

  Walker, Richard J ^a,b   Richardson, Justin A ^b   Henderson, Robert K ^a  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE INDUSTRY; AVALANCHE DIODES; CMOS INTEGRATED CIRCUITS; COSTS; IMAGE ENHANCEMENT; IMAGE SENSORS; LIGHT; OPTICAL CORRELATION; PARTICLE BEAMS; PIXELS; STEREO IMAGE PROCESSING;

ANALOG ELECTRONICS; DISTANCE COMPUTATION; FREQUENCY MODULATED; HIGH FREQUENCY HF; SINGLE PHOTON AVALANCHE DIODE; STEREOSCOPIC CAMERA; STRUCTURED LIGHT SYSTEMS; TIME OF FLIGHT (TOF) CAMERAS;

CAMERAS;

EID: 79955746295     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2011.5746374     Document Type: Conference Paper

References (6)

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2. D. Stoppa, et. al., "An 80x60 Range Image Sensor based on 10?m 50MHz Lock-In Pixels in 0.18μm CMOS", ISSCC Dig. Tech. Papers, pp 406-407, Feb. 2010.
3. C. Niclass, et. al., "A 128x128 Single-Photon Imager with On-Chip Column-Level 10b Time-to-Digital Converter Array Capable of 97ps Resolution", ISSCC Dig. Tech. Papers, pp. 44-45, Feb. 2008.
4. C. Niclass, et al., "Single-Photon Synchronous Detection", IEEE J. Solid-State Circuits, vol 44, pp. 1977-1989, July 2009.
5. C. P. L. van Vroonhoven and K. A. A. Makinwa, "A CMOS Temperature-to-Digital Converter with an Inaccuracy of ±0.5°C (3σ) from -55 to 125°C", ISSCC Dig. Tech. Papers, pp. 576-577, Feb 2008.
6. J. A. Richardson, et. al., "Low Dark Count Single-Photon Avalanche Diode Structure Compatible With Standard Nanometer Scale CMOS Technology," IEEE Photonics Technology Letters, vol.21, no.14, pp.1020-1022, July 2009.