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Volumn , Issue , 2012, Pages 89-92

High frequency noise potentialities of reported CMOS 65 nm SOI technology on flexible substrate

Author keywords

Flexible transistors; HF noise performance; SOI CMOS

Indexed keywords

ASSOCIATED GAIN; FLEXIBLE SUBSTRATE; FLEXIBLE TRANSISTORS; GHZ FREQUENCIES; HIGH-FREQUENCY NOISE; MINIMUM NOISE FIGURE; NOISE MEASUREMENTS; NOISE PERFORMANCE; RIGID SUBSTRATES; S-PARAMETERS MEASUREMENT; SOI CMOS; SOI N-MOSFETS; SOI TECHNOLOGY;

EID: 84858742004     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SiRF.2012.6160147     Document Type: Conference Paper
Times cited : (11)

References (11)
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  • 6
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    • (2005) IEEE Trans. Microw. Tech. , vol.53 , Issue.9 , pp. 2917-2925
    • Tiemeijer, L.1    Havens, R.2    De Kort, R.3    Scholten, A.4
  • 8
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    • A new method for determining the FET Small-Signal Equivalent Circuit
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    • G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, "A new method for determining the FET Small-Signal Equivalent Circuit," IEEE Trans. Microw. Tech., vol. 36, no.7, pp. 1151-1159, July. 1988
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  • 9
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    • Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependance
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    • M. W. Pospieszalski, "Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependance," IEEE Trans. Microw. Theory. Tech., vol. MTT-37, no.9, pp. 1340-1350, Sep. 1989.
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  • 10
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    • A new Extrinsinc Equivalent Circuit of HEMT's Including Noise for Millimeter-Wave Circuit Design
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    • G. Dambrine, H. Happy, F. Danneville, and A. Cappy , "A new Extrinsinc Equivalent Circuit of HEMT's Including Noise for Millimeter-Wave Circuit Design," IEEE Trans. Microw Theory & Tech., vol. 46, no.9, pp. 1231-1236, Sept. 1998
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  • 11
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    • Strain enhanced DC-RF performance of 0.13 μm nMOSFETs on flexible plastic substrate
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    • A. Chin, H.L. Kao, C.H. Kao, C.C. Liao, Y.Y. Tseng andC.C. Chi, "Strain enhanced DC-RF performance of 0.13 μm nMOSFETs on flexible plastic substrate" IEEE Electronics Letters., vol. 42, no.14, pp. 489-491, 6th July 2006
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.