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Volumn 88, Issue 8, 2006, Pages

Effect of SiO 2 incorporation on stability and work function of conducting MoO 2

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL MEASUREMENTS; INTERFACIAL SIOX LAYER; MOO 2; WORK FUNCTION;

CAPACITORS; ELECTRIC CONDUCTIVITY; HIGH TEMPERATURE EFFECTS; MOLYBDENUM COMPOUNDS; SEMICONDUCTOR DEVICES; THERMODYNAMIC STABILITY; VACUUM;

SILICA;

EID: 84858559123 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2176859 Document Type: Article

Times cited : (25)

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