Electron drift-mobility measurements in polycrystalline CuIn 1-xGa xSe 2 solar cells

Applied Physics Letters

Volumn 100, Issue 10, 2012, Pages

  Dinca, S A ^a   Schiff, E A ^a   Shafarman, W N ^b   Egaas, B ^c   Noufi, R ^c   Young, D L ^c  

^a SYRACUSE UNIVERSITY   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELL EFFICIENCY; ELECTRON DRIFT MOBILITY; P-TYPE; PHOTOCARRIER; POLYCRYSTALLINE; POLYCRYSTALLINE THIN FILM; TEMPERATURE DEPENDENT; TIME OF FLIGHT MEASUREMENTS;

ELECTRON MOBILITY; GALLIUM; SEMICONDUCTING SELENIUM COMPOUNDS;

ELECTRONS;

EID: 84858406013     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3692165     Document Type: Article

References (21)

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