Toward spectral-domain optical coherence tomography on a chip

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 18, Issue 3, 2012, Pages 1223-1233

  Akca, B Imran ^a   Nguyen, Van Duc ^b   Kalkman, Jeroen ^b   Ismail, Nur ^a   Sengo, Gabriel ^a   Sun, Fei ^c   Driessen, Alfred ^a   Van Leeuwen, Ton G ^b,d   Pollnau, Markus ^a   Wörhoff, Kerstin ^a   De Ridder, René M ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

^c INSTITUTE OF MICROELECTRONICS   (Singapore)

^d UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Arrayed waveguide grating (AWG); optical coherence tomography (OCT); optical waveguides; silicon oxynitride (SiON); spectrometer

Indexed keywords

AXIAL RESOLUTIONS; BROADBAND SOURCES; CHANNEL SPACINGS; IMAGING DEPTH; OPTICAL SPECTROMETERS; SILICON OXYNITRIDES; SPECTRAL-DOMAIN OPTICAL COHERENCE TOMOGRAPHY; WAVEGUIDE TECHNOLOGY;

MICHELSON INTERFEROMETERS; OPTICAL TOMOGRAPHY; OPTICAL WAVEGUIDES; SILICON NITRIDE; SPECTROMETERS; SPECTROMETRY; WAVEGUIDES;

ARRAYED WAVEGUIDE GRATINGS;

EID: 84858224715     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2011.2171674     Document Type: Article

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