Miniature 10 kHz thermo-optic delay line in silicon

Optics Letters

Volumn 35, Issue 23, 2010, Pages 4027-4029

  Margallo Balbás, Eduardo ^a   Geljon, Max ^b   Pandraud, Grégory ^b   French, Patrick J ^b  

^a Medlumics SL   (Spain)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY LINE; KEY COMPONENT; LINE SCAN; OPTICAL COHERENCE TOMOGRAPHY; PLANAR LIGHTWAVE CIRCUIT TECHNOLOGY; SCAN RANGE; SCAN RATES; THERMOOPTIC EFFECTS; THERMOOPTICS; TIME DOMAIN;

PHOTONICS; TOMOGRAPHY;

WAVES;

SILICON;

ALGORITHM; ARTICLE; CALIBRATION; CHEMISTRY; LIGHT RELATED PHENOMENA; METHODOLOGY; OPTICAL COHERENCE TOMOGRAPHY; TEMPERATURE;

ALGORITHMS; CALIBRATION; OPTICAL PROCESSES; SILICON; TEMPERATURE; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 78650822999     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.35.004027     Document Type: Article

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