Spectral domain optical coherence tomography imaging with an integrated optics spectrometer

Optics Letters

Volumn 36, Issue 7, 2011, Pages 1293-1295

  Nguyen, Duc V ^a   Akca, B Imran ^b   Wörhoff, Kerstin ^b   De Ridder, René M ^b   Pollnau, Markus ^b   Van Leeuwen, Ton G ^a,c   Kalkman, Jeroen ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

A-CENTER; AXIAL RESOLUTIONS; DESIGN PARAMETERS; FREE SPECTRAL RANGE; MULTI-LAYERED SCATTERING; OCT IMAGING; SILICON OXYNITRIDES; SPECTRAL DOMAIN OPTICAL COHERENCE TOMOGRAPHIES;

PHOTONICS; SILICON NITRIDE; SPECTROMETERS; SPECTROMETRY; STRAIN MEASUREMENT; TOMOGRAPHY; WAVEGUIDES;

ARRAYED WAVEGUIDE GRATINGS;

SILICON;

ARTICLE; CHEMISTRY; IMAGE QUALITY; INSTRUMENTATION; INTERFEROMETRY; METHODOLOGY; OPTICAL COHERENCE TOMOGRAPHY; OPTICAL INSTRUMENTATION; SPECTROSCOPY; SYSTEM ANALYSIS;

INTERFEROMETRY; LENSES; OPTICAL DEVICES; PHANTOMS, IMAGING; SILICON; SPECTRUM ANALYSIS; SYSTEMS INTEGRATION; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 79956136742     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.001293     Document Type: Article

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