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Journal of Applied Physics

Volumn 111, Issue 4, 2012, Pages

Femtosecond electron diffraction: Preparation and characterization of (110)-oriented bismuth films

(5) Moriena, Gustavo a Hada, Masaki b,c Sciaini, Germn a,b Matsuo, Jiro c Dwayne Miller, R J a,b

a UNIVERSITY OF TORONTO (Canada)

b UNIVERSITY OF HAMBURG (Germany)

c KYOTO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC PHONONS; ALL-OPTICAL; ATOMIC MOTION; BI FILMS; BISMUTH FILM; CONTROLLED EVAPORATION; DE BROGLIE WAVELENGTH; DETECTION SCHEME; ELASTIC PROPERTIES; FEMTOSECOND ELECTRON DIFFRACTION; FEMTOSECOND OPTICAL EXCITATION; FREESTANDING FILMS; HIGH QUALITY; LATTICE DISTORTIONS; LATTICE MATCHING; NANO-SCALE MATERIALS; NONCONTACT METHODS; POTASSIUM CHLORIDE; PUMP-PROBE EXPERIMENTS; SHEAR DISPLACEMENT; TRANSVERSE DIRECTIONS; ULTRA-THIN MEMBRANES;

BISMUTH; CHLORINE COMPOUNDS; ELECTRON DIFFRACTION; OPTICAL PUMPING; SPHERES; ULTRATHIN FILMS;

FILM PREPARATION;

EID: 84857854665 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3684975 Document Type: Article

Times cited : (25)

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