Excitation of longitudinal and transverse coherent acoustic phonons in nanometer free-standing films of (001) Si

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 9, 2009, Pages

  Harb, Maher ^a   Peng, Weina ^b   Sciaini, Germán ^a   Hebeisen, Christoph T ^a   Ernstorfer, Ralph ^a,c   Eriksson, Mark A ^b   Lagally, Max G ^b   Kruglik, Sergei G ^a   Miller, R J Dwayne ^a  

^a UNIVERSITY OF TORONTO   (Canada)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

^c MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 63249135326     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.094301     Document Type: Article

References (30)

1. C. Thomsen, H. T. Grahn, H. J. Maris, and J. Tauc, Phys. Rev. B 34, 4129 (1986). 10.1103/PhysRevB.34.4129
2. H. T. Grahn, H. J. Maris, and J. Tauc, IEEE J. Quantum Electron. 25, 2562 (1989). 10.1109/3.40643
3. P. Basseras, S. M. Gracewski, G. W. Wicks, and R. J. D. Miller, J. Appl. Phys. 75, 2761 (1994). 10.1063/1.356214
4. T. Pezeril, P. Ruello, S. Gougeon, N. Chigarev, D. Mounier, J.-M. Breteau, P. Picart, and V. Gusev, Phys. Rev. B 75, 174307 (2007). 10.1103/PhysRevB.75.174307
5. O. Matsuda, O. B. Wright, D. H. Hurley, V. E. Gusev, and K. Shimizu, Phys. Rev. Lett. 93, 095501 (2004). 10.1103/PhysRevLett.93.095501
6. T. Pezeril, V. Gusev, D. Mounier, N. Chigarev, and P. Ruello, J. Phys. D 38, 1421 (2005). 10.1088/0022-3727/38/9/015
7. C. Rossignol, J. M. Rampnoux, M. Perton, B. Audoin, and S. Dilhaire, Phys. Rev. Lett. 94, 166106 (2005). 10.1103/PhysRevLett.94.166106
8. K. A. Nelson, J. Appl. Phys. 53, 6060 (1982). 10.1063/1.331556
9. S. Nie, X. Wang, H. Park, R. Clinite, and J. Cao, Phys. Rev. Lett. 96, 025901 (2006). 10.1103/PhysRevLett.96.025901
10. C. Rose-Petruck, R. Jimenez, T. Guo, A. Cavalleri, C. W. Siders, F. Rksi, J. A. Squier, B. C. Walker, K. R. Wilson, and C. P. J. Barty, Nature (London) 398, 310 (1999). 10.1038/18631
11. A. M. Lindenberg, I. Kang, S. L. Johnson, T. Missalla, P. A. Heimann, Z. Chang, J. Larsson, P. H. Bucksbaum, H. C. Kapteyn, H. A. Padmore, R. W. Lee, J. S. Wark, and R. W. Falcone, Phys. Rev. Lett. 84, 111 (2000). 10.1103/PhysRevLett.84.111
12. A. Cavalleri, C. W. Siders, F. L. H. Brown, D. M. Leitner, C. Tóth, J. A. Squier, C. P. J. Barty, K. R. Wilson, K. Sokolowski-Tinten, M. von der Linde, M. Kammler, and M. Horn von Hoegen, Phys. Rev. Lett. 85, 586 (2000). 10.1103/PhysRevLett.85.586
13. J. Larsson, A. Allen, P. H. Bucksbaum, R. W. Falcone, A. Lindenberg, G. Naylor, T. Missalla, D. A. Reis, K. Scheidt, A. Sjogren, P. Sondhauss, M. Wulff, and J. S. Wark, Appl. Phys. A: Mater. Sci. Process. 75, 467 (2002). 10.1007/s003390201421
14. M. Bargheer, N. Zhavoronkov, Y. Gritsai, J. C. Woo, D. S. Kim, M. Woerner, and T. Elsaesser, Science 306, 1771 (2004). 10.1126/science.1104739
15. A. Morak, T. Kämpfer, I. Uschmann, A. Lübcke, E. Förster, and R. Sauerbrey, Phys. Status Solidi B 243, 2728 (2006). 10.1002/pssb.200542387
16. U. Shymanovich, M. Nicoul, J. Blums, K. Sokolowski-Tinten, A. Tarasevitch, T. Wietler, M. Horn von Hoegen, and D. von der Linde, Appl. Phys. A: Mater. Sci. Process. 87, 7 (2007). 10.1007/s00339-007-3863-6
17. C. T. Hebeisen, G. Sciaini, M. Harb, R. Ernstorfer, T. Dartigalongue, S. G. Kruglik, and R. J. D. Miller, Opt. Express 16, 3334 (2008). 10.1364/OE.16.003334
18. M. Roberts, L. J. Klein, D. E. Savage, K. A. Slinker, M. Friesen, G. Celler, M. A. Eriksson, and M. G. Lagally, Nature Mater. 5, 388 (2006). 10.1038/nmat1606
19. S. A. Scott and M. G. Lagally, J. Phys. D 40, R75 (2007). 10.1088/0022-3727/40/4/R01
20. P. D. Desai, J. Phys. Chem. Ref. Data 15, 967 (1986).
21. M. Harb, R. Ernstorfer, C. T. Hebeisen, G. Sciaini, W. Peng, T. Dartigalongue, M. A. Eriksson, M. G. Lagally, S. G. Kruglik, and R. J. D. Miller, Phys. Rev. Lett. 100, 155504 (2008). 10.1103/PhysRevLett.100.155504
22. P. E. Champness, Electron Diffraction in the Transmission Electron Microscope, Garland Science, 1st ed. (BIOS Scientific Publishers, Oxford, UK 2001).
23. H. Hashimoto, J. Phys. Soc. Jpn. 9, 150 (1954). 10.1143/JPSJ.9.150
24. C. Kittel, Introduction to Solid State Physics (Wiley, New York, 1986).
25. M. Harb, R. Ernstorfer, T. Dartigalongue, C. T. Hebeisen, R. E. Jordan, and R. J. D. Miller, J. Phys. Chem. B 110, 25308 (2006). 10.1021/jp064649n
26. E. J. Yoffa, Phys. Rev. B 23, 1909 (1981). 10.1103/PhysRevB.23.1909
27. The difficulty in solving the equations of elasticity is also due to three-dimensional character of the problem. The one-dimensional problem, which is relevant to experiments where the only excited mode is the longitudinal, has an analytic solution derived by Thomson (see Ref.). To our knowledge, the only treatment of the three-dimensional problem is the one proposed by Pezeril (Refs.). However, these are for different geometries and boundary conditions than the free-standing film.
28. Although we excite the sample at ∼320 K, the thermal-expansion coefficient of Si of 2.6× 10-6 K-1 is approximately ten times smaller than that of elements examined in other studies. For example, in Zn the c -axis coefficient is 6.4× 10-5 K-1 and the one along the perpendicular is 1.3× 10-5 K-1 (Ref.). Therefore, this strong excitation is needed to generate sufficient strains to observe the effect.
29. P. Sondhauss, O. Synnergren, T. N. Hansen, S. E. Canton, H. Enquist, A. Srivastava, and J. Larsson, Phys. Rev. B 78, 115202 (2008). 10.1103/PhysRevB.78. 115202
30. L. Genberg, Q. Bao, S. Gracewski, and R. J. D. Miller, Chem. Phys. 131, 81 (1989). 10.1016/0301-0104(89)87082-X