Ultrathin epitaxially grown bismuth (111) membranes

Applied Physics Letters

Volumn 93, Issue 9, 2008, Pages

  Payer, T ^a   Rajkovic I ^a   Ligges, M ^a   Von Der Linde, D ^a   Horn Von Hoegen, M ^a   Meyer Zu Heringdorf, F J ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; CRYSTALLOGRAPHY; DIFFRACTION; DISSOLUTION; ELECTRON DIFFRACTION; EPITAXIAL FILMS; EPITAXIAL GROWTH; LATTICE CONSTANTS; MOLECULAR BEAM EPITAXY; MOLECULAR DYNAMICS; SODIUM CHLORIDE; ULTRATHIN FILMS;

ETCHING TECHNIQUES; EX-SITU; FILM QUALITIES; MOLECULAR BEAM EPITAXIAL GROWTH;

SINGLE CRYSTALS;

EID: 51349152713     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2976558     Document Type: Article

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