Purcell-factor-enhanced scattering from Si nanocrystals in an optical microcavity

Physical Review Letters

Volumn 103, Issue 2, 2009, Pages

  Kippenberg, T J ^a,c,d   Tchebotareva, A L ^b   Kalkman, J ^b   Polman, A ^b   Vahala, K J ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b FOM INSTITUTE AMOLF   (Netherlands)

^c MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^d EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CAPTURE EFFICIENCY; CAVITY MODE; ENHANCED SCATTERING; FREE-SPACE VALUES; LOWER BOUNDS; MEASUREMENT TECHNIQUES; MODE SPLITTING; OPTICAL DENSITIES; OPTICAL MICROCAVITIES; PHOTON FLUX; PURCELL FACTOR; SCATTERING PROCESS; SI NANOCRYSTAL; SILICON NANOCRYSTALS; ULTRA-HIGH;

CONTROL THEORY; MICROCAVITIES; NANOCRYSTALS; SCATTERING;

LIGHT TRANSMISSION;

EID: 68849104405     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.103.027406     Document Type: Article

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