Characterization of electroplated ZnTe coatings

Ionics

Volumn 18, Issue 3, 2012, Pages 299-306

  Mahalingam, T ^a   Dhanasekaran, V ^a   Sundaram, K ^a   Kathalingam, A ^b   Rhee, Jin Koo ^b  

^a ALAGAPPA UNIVERSITY   (India)

^b Dongguk University   (South Korea)

Author keywords

Electrochemical characterizations; Morphology; Optical properties; Structural studies; Thin films

Indexed keywords

BINARY FILMS; CONDUCTING GLASS; CUBIC STRUCTURE; DEPOSITED FILMS; DIRECT TRANSITION; ELECTROCHEMICAL CHARACTERIZATIONS; ELECTROCHEMICAL TECHNIQUES; ENERGY DISPERSIVE ANALYSIS; MICROSTRUCTURAL PARAMETERS; OPTIMUM POTENTIAL; POLYCRYSTALLINE; REFLECTION SPECTRA; STRUCTURAL STUDIES; X-RAY DIFFRACTION STUDIES; ZINC BLENDE; ZINC TELLURIDES; ZNTE THIN FILMS;

CYCLIC VOLTAMMETRY; MORPHOLOGY; NANORODS; NEAR INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; REACTION KINETICS; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC; ZINC COATINGS;

ZINC COMPOUNDS;

EID: 84857658945     PISSN: 09477047     EISSN: 18620760     Source Type: Journal    
DOI: 10.1007/s11581-011-0623-6     Document Type: Article

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