Characterization of II-VI compounds on porous substrates

Thin Solid Films

Volumn 361, Issue , 2000, Pages 213-217

  Ernst, K ^a   Sieber, I ^a   Neumann Spallart, M ^b   Lux Steiner, M Ch ^a   Konenkamp R ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN SOLIDS; ELECTRODEPOSITION; MORPHOLOGY; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; STOICHIOMETRY; SUBSTRATES; TITANIUM DIOXIDE;

POROUS SUBSTRATES;

SEMICONDUCTOR GROWTH;

EID: 0033887886     PISSN: 00406090     EISSN: None     Source Type: None    
DOI: 10.1016/S0040-6090(99)00836-6     Document Type: Article

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