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Physical Review Letters

Volumn 108, Issue 8, 2012, Pages

Ultrafast photocurrent measurement of the escape time of electrons and holes from carbon nanotube p-i-n photodiodes

(4) Gabor, Nathaniel M a,e Zhong, Zhaohui b Bosnick, Ken c McEuen, Paul L a,d

a Laboratory of Atomic and Solid State Physics and Cornell Center for Materials Research (United States)

b UNIVERSITY OF MICHIGAN (United States)

c NATIONAL RESEARCH COUNCIL CANADA (Canada)

d Massachusetts Institute of Technology ^* (United States)

e MASSACHUSETTS INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS; CARRIER EFFECTIVE MASS; DECAY TIME; ELECTRONS AND HOLES; ESCAPE TIME; LOWER ENERGIES; PHOTOCURRENT MEASUREMENT; PHOTOCURRENT RESPONSE; PHOTON ENERGY; PIN PHOTODIODE; SUB-BANDS; SUBPICOSECOND PULSE; ULTRA-FAST; VARIABLE TIME DELAY;

CARBON NANOTUBES; PHOTODIODES;

PHOTOCURRENTS;

EID: 84857589595 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.108.087404 Document Type: Article

Times cited : (49)

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