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Volumn 108, Issue 9, 2012, Pages

Ultrafast x-ray scattering of xenon nanoparticles: Imaging transient states of matter

(15) Bostedt, C a,b Eremina, E a Rupp, D a Adolph, M a Thomas, H a Hoener, M a De Castro, A R B c,d Tiggesbaumker J e Meiwes Broer, K H e Laarmann, T f Wabnitz, H f Plonjes E f Treusch, R f Schneider, J R f Moller T a

a TECHNISCHE UNIVERSITÄT BERLIN (Germany)

b SLAC NATIONAL ACCELERATOR LABORATORY (United States)

c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON (Brazil)

d UNIVERSITY OF CAMPINAS (Brazil)

e UNIVERSITY OF ROSTOCK (Germany)

f DESY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL SPECTROSCOPY; ELECTRONIC CONFIGURATION; EXCITED SYSTEMS; FEMTOSECOND TIME SCALE; FEMTOSECONDS; GASPHASE; HIGH FLUX; MICRO-PARTICLES; NANOPLASMAS; POWER DENSITIES; SINGLE-PARTICLE; SINGLE-SHOT; TRANSIENT CHANGES; TRANSIENT STATE; ULTRA-FAST; ULTRAFAST PROCESS;

OPTICAL CONSTANTS; X RAY DIFFRACTION;

XENON;

EID: 84857561837 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.108.093401 Document Type: Article

Times cited : (97)

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