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Physical Review Letters

Volumn 99, Issue 21, 2007, Pages

Photoelectric effect at ultrahigh intensities

(6) Sorokin, A A a,b Bobashev, S V b Feigl, T c Tiedtke, K d Wabnitz, H d Richter, M a

a PHYSIKALISCH TECHNISCHE BUNDESANSTALT (Germany)

b IOFFE INSTITUTE (Russian Federation)

c FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING (Germany)

d DESY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FREE ELECTRON LASERS; IRRADIATION; MIRRORS; PHOTOIONIZATION; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; WAVELENGTH; XENON;

ION CHARGES; MULTILAYER MIRRORS; NONPERTURBATIVE DESCRIPTION; SPECTROSCOPY EXPERIMENTS; ULTRAHIGH INTENSITIES;

PHOTOELECTRICITY;

EID: 36248987899 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.99.213002 Document Type: Article

Times cited : (253)

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