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Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 79, Issue 4, 2009, Pages

Ionization and charge migration through strong internal fields in clusters exposed to intense x-ray pulses

(3) Gnodtke, Christian a,b Saalmann, Ulf a,b Rost, Jan M a,b

a MAX PLANCK INSTITUT FÜR PHYSIK KOMPLEXER SYSTEME (Germany)

b Center for Free Electron Laser Science (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE MIGRATION; CORE-SHELL; DIFFRACTION IMAGES; DIFFRACTIVE IMAGING; ELECTRONIC CHARGES; EMBEDDED CLUSTERS; FIELD IONIZATION; FINITE SAMPLES; INTENSE LASER PULSE; INTERNAL FIELD; OUTER SHELLS; SACRIFICIAL LAYER; SHORT PULSE; X RAY PULSE; X-RAY FREE ELECTRON LASERS;

HELIUM; IONIZATION; MILITARY PHOTOGRAPHY; NEON;

PULSED LASER APPLICATIONS;

EID: 66049143351 PISSN: 10502947 EISSN: 10941622 Source Type: Journal
DOI: 10.1103/PhysRevA.79.041201 Document Type: Article

Times cited : (56)

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