Size- and shape-controlled electrochemical deposition of metal nanoparticles by tapping mode atomic force microscopy

Journal of Physical Chemistry C

Volumn 116, Issue 6, 2012, Pages 3995-3999

  Tanabe, Ichiro ^a   Tatsuma, Tetsu ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AG NANOPARTICLE; AG NANORODS; APPLIED VOLTAGES; AU NANOPARTICLE; CONDUCTIVE SUBSTRATES; CONTACT MODES; CONTROLLED SIZE; ELECTROCHEMICAL DEPOSITION; ELECTROCHEMICAL METHODS; SHAPE-CONTROLLED; TAPPING MODES; TAPPING-MODE ATOMIC FORCE MICROSCOPY; VOLTAGE APPLICATIONS;

ATOMIC FORCE MICROSCOPY; ELASTICITY; GOLD; GOLD COATINGS; METAL NANOPARTICLES; NANORODS; REDUCTION;

SILVER;

EID: 84857394112     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp2123086     Document Type: Article

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