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Journal of Applied Physics

Volumn 111, Issue 3, 2012, Pages

Electrical properties of individual NiFe/Pt multilayer nanowires measured in situ in a scanning electron microscope

(4) Elawayeb, Mohamed a Peng, Yong b Briston, Kevin J a Inkson, Beverley J a

a UNIVERSITY OF SHEFFIELD (United Kingdom)

b LANZHOU UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL MEASUREMENT; FAILURE CURRENTS; IN-SITU; MULTILAYER NANOWIRES; NANOMANIPULATORS; POLYCRYSTALLINE MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPE;

MULTILAYERS; NANOWIRES; PLATINUM; SCANNING ELECTRON MICROSCOPY;

ELECTRIC PROPERTIES;

EID: 84857383188 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3679558 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.