SCOPUS 정보 검색 플랫폼

Superlattices and Microstructures

Volumn 51, Issue 3, 2012, Pages 421-429

Effects of thermal oxidation temperature on vacuum evaporated tin dioxide film

(7) Cakmak H M a Cetinkara H A a Kahraman, S a Bayansal, F a Tepe, M b Guder H S a Cipiloglu M A c

a MUSTAFA KEMAL UNIVERSITY (Turkey)

b EGE UNIVERSITY (Turkey)

c CELAL BAYAR UNIVERSITY (Turkey)

Author keywords

SnO 2; Thermal evaporation; Thermal oxidation

Indexed keywords

ELECTRICAL RESISTIVITY MEASUREMENTS; QUARTZ SUBSTRATE; REFLECTION PEAKS; RESISTIVITY VALUES; SEM IMAGE; SNO 2; SPECTRAL RANGE; TEMPERATURE DEPENDENT; TETRAGONAL STRUCTURE; THERMAL OXIDATION; TIN DIOXIDE FILM; X RAY MEASUREMENTS;

ELECTRIC CONDUCTIVITY; QUARTZ; SCANNING ELECTRON MICROSCOPY; THERMAL EVAPORATION; TIN; VACUUM EVAPORATION; X RAY DIFFRACTION;

OXIDATION;

EID: 84857360735 PISSN: 07496036 EISSN: 10963677 Source Type: Journal
DOI: 10.1016/j.spmi.2012.01.006 Document Type: Article

Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.