Resistive switching phenomena in thin films: Materials, devices, and applications

MRS Bulletin

Volumn 37, Issue 2, 2012, Pages 108-114

  Strukov, D B ^a   Kohlstedt, H ^b  

^a University of California   (United States)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

electronic material; memory; Microelectronics; nanoscale; thin film

Indexed keywords

ELECTRICAL STRESS; ELECTRONIC CONDUCTIVITY; ELECTRONIC MATERIALS; ELECTRONIC MEMORIES; MATERIAL SYSTEMS; MEMORY; NANO SCALE; NEUROMORPHIC COMPUTING; PHYSICAL MECHANISM; RE-CONFIGURABLE; RESEARCH ACTIVITIES; RESISTIVE SWITCHING;

MATERIALS SCIENCE; MICROELECTRONICS; SWITCHING SYSTEMS; THIN FILM DEVICES;

THIN FILMS;

EID: 84857340323     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2012.2     Document Type: Review

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