Microscopic evidence for the modification of the electronic structure at grain boundaries of Cu(In 1-x,Ga x)Se 2 films

Physical Review Letters

Volumn 108, Issue 7, 2012, Pages

  Azulay, Doron ^a   Balberg, Isaac ^a   Millo, Oded ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; GA CONTENT; P-TYPE; POLYCRYSTALLINE; SCANNING TUNNELING SPECTROSCOPY; TYPE INVERSION;

ATOMIC FORCE MICROSCOPY; COPPER; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; GRAIN BOUNDARIES; SCANNING TUNNELING MICROSCOPY;

GALLIUM;

EID: 84857250638     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.108.076603     Document Type: Article

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