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Volumn 9, Issue 2, 2012, Pages 188-196

In situ quartz crystal microbalance measurements of thin protein film plasma removal

Author keywords

decontamination; plasma etching; proteins; quartz crystal microbalance; self limiting etching kinetic; surface

Indexed keywords

CHEMICAL COMPOSITIONS; CONTAMINATION LEVELS; DEPOSIT REMOVAL; DIRECT CONTACT; ETCHING KINETICS; IN-SITU; MASS LOSS; MASS REMOVAL RATE; MORPHOLOGICAL CHANGES; MORPHOLOGICAL MODIFICATION; PLASMA ETCHING PROCESS; PLASMA-INDUCED; PROTEIN FILMS; QUARTZ CRYSTAL; REMOVAL RATE; SELF-LIMITING ETCHING KINETIC; SURGICAL INSTRUMENT; TREATMENT TIME;

EID: 84856890815     PISSN: 16128850     EISSN: 16128869     Source Type: Journal    
DOI: 10.1002/ppap.201100098     Document Type: Article
Times cited : (9)

References (29)
  • 24
    • 84856888057 scopus 로고    scopus 로고
    • University of Surrey, Guildford, England.
    • G. Friedli, Phd Dissertation. University of Surrey, Guildford, England 1996.
    • (1996) Phd Dissertation
    • Friedli, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.