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Volumn 33, Issue 2, 2012, Pages 161-163

Floating-body diode-a novel DRAM device

Author keywords

DRAM; FinFET; floating body; floating body cell (FBC); silicon on insulator (SOI)

Indexed keywords

CMOS COMPATIBLE; DRAM CELLS; DRAM DEVICES; EMBEDDED MEMORIES; FINFET; FLOATING BODIES; FLOATING-BODY CELL; MEMORY OPERATIONS; OPERATION RANGE; RETENTION TIME; SILICON ON INSULATOR; SILICON-ON-INSULATORS; SOURCE AND DRAINS; UNIT CELLS;

EID: 84856296218     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2011.2177239     Document Type: Article
Times cited : (16)

References (6)
  • 1
    • 0036477440 scopus 로고    scopus 로고
    • A capacitor-less 1T-DRAM cell
    • DOI 10.1109/55.981314, PII S0741310602014945
    • S. Okhonin, M. Nagoga, J. M. Sallese, and P. Fazan, "A capacitor-less 1T-DRAM cell," IEEE Electron Device Letters, vol. 23, no. 2, pp. 85-87, Feb. 2002. (Pubitemid 34504407)
    • (2002) IEEE Electron Device Letters , vol.23 , Issue.2 , pp. 85-87
    • Okhonin, S.1    Nagoga, M.2    Sallese, J.M.3    Fazan, P.4
  • 2
    • 52349112614 scopus 로고    scopus 로고
    • A scaled floating body cell (FBC) memory with high-k+metal gate on thin-silicon and thin-BOX for 16-nm technology node and beyond
    • I. Ban, U. E. Avci, D. L. Kencke, and P. L. D. Chang, "A scaled floating body cell (FBC) memory with high-k+metal gate on thin-silicon and thin-BOX for 16-nm technology node and beyond," in VLSI Symp. Tech. Dig., 2008, pp. 92-93.
    • (2008) VLSI Symp. Tech. Dig. , pp. 92-93
    • Ban, I.1    Avci, U.E.2    Kencke, D.L.3    Chang, P.L.D.4
  • 3
    • 33645751666 scopus 로고    scopus 로고
    • A capacitorless 1T-DRAM technology using gate-induced drain-leakage (GIDL) current for low-power and high-speed embedded memory
    • Apr.
    • E. Yoshida and T. Tanaka, "A capacitorless 1T-DRAM technology using gate-induced drain-leakage (GIDL) current for low-power and high-speed embedded memory," IEEE Trans. Electron Devices, vol. 53, no. 4, pp. 692-697, Apr. 2006.
    • (2006) IEEE Trans. Electron Devices , vol.53 , Issue.4 , pp. 692-697
    • Yoshida, E.1    Tanaka, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.