Fullerenes, nanotubes, and graphite as matrices for collision mechanism in secondary ion mass spectrometry: Determination of cyclodextrin

Journal of the American Society for Mass Spectrometry

Volumn 22, Issue 12, 2011, Pages 2179-2187

  Stupavska, Monika ^a   Jerigova, Monika ^a,b   Michalka, Miroslav ^b   Hasko, Daniel ^b   Szoecs, Vojtech ^a   Velic, Dusan ^a,b  

^a Faculty of Natural Sciences   (Slovakia)

^b INTERNATIONAL LASER CENTER   (Slovakia)

Author keywords

Fullerene; Graphite; Matrix effect; Nanotube; ToF SIMS; Yield enhancement

Indexed keywords

CARBON SPECIES; CATIONIZED; COLLISION MECHANISMS; DEPOSITION FILMS; FULLERENE FILMS; GLUCOPYRANOSE; HIGHLY ORDERED PYROLYTIC GRAPHITES; MATRIX; MATRIX EFFECTS; MOLECULAR ANALYSIS; PHYSICAL MECHANISM; SECONDARY ION EMISSION; SECONDARY IONS; STRUCTURED SURFACES; TOF SIMS; YIELD ENHANCEMENT;

ATOMIC FORCE MICROSCOPY; GRAPHITE; IONS; NANOTUBES; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPECTROMETRY;

FULLERENES;

CYCLODEXTRIN; FULLERENE; GRAPHITE; SINGLE WALLED NANOTUBE;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CONTROLLED STUDY; MASS SPECTROMETRY; PROCESS OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY;

CYCLODEXTRINS; FULLERENES; GRAPHITE; MASS SPECTROMETRY; MICROSCOPY, ELECTRON, SCANNING; NANOTUBES;

EID: 84856152447     PISSN: 10440305     EISSN: 18791123     Source Type: Journal    
DOI: 10.1007/s13361-011-0239-0     Document Type: Article

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