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Volumn 104, Issue 29, 2000, Pages 6785-6800

High yield events of molecular emission induced by kiloelectronvolt particle bombardment

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; COMPUTER SIMULATION; ION BOMBARDMENT; KINETIC ENERGY; MATHEMATICAL MODELS; NUMERICAL METHODS; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SILVER; SPUTTERING;

EID: 0034226953     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp001374h     Document Type: Article
Times cited : (75)

References (65)
  • 4
    • 0004232184 scopus 로고    scopus 로고
    • Vickerman, J. C., Briggs, D., Henderson, A., Eds; SurfaceSpectra: Manchester
    • Hagenhoff, B. In The Static SIMS Library; Vickerman, J. C., Briggs, D., Henderson, A., Eds; SurfaceSpectra: Manchester, 1997; p 39.
    • (1997) The Static SIMS Library , pp. 39
    • Hagenhoff, B.1
  • 14
    • 33646095122 scopus 로고    scopus 로고
    • Gillen, G., Lareau, R., Bennett, J., Stevie, F., Eds.; Wiley: New York
    • Secondary Ion Mass Spectrometry, SIMS XI Proceedings; Gillen, G., Lareau, R., Bennett, J., Stevie, F., Eds.; Wiley: New York, 1998.
    • (1998) Secondary Ion Mass Spectrometry, SIMS XI Proceedings
  • 46
    • 33646106719 scopus 로고    scopus 로고
    • Computer animations available online at
    • Beardmore, K.; Smith, R. Computer animations available online at http://lboro.ac.uk/departments/ma/research/molecular/index.html.
    • Beardmore, K.1    Smith, R.2
  • 65
    • 33646116745 scopus 로고    scopus 로고
    • Benninghoven, A., Bertrand, P., Migeon, H.-N., Eds.; Elsevier: Amsterdam, in press
    • Gillen, G. In Secondary Ion Mass Spectrometry, SIMS XII Proceedings; Benninghoven, A., Bertrand, P., Migeon, H.-N., Eds.; Elsevier: Amsterdam, 2000; in press.
    • (2000) Secondary Ion Mass Spectrometry, SIMS XII Proceedings
    • Gillen, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.