메뉴 건너뛰기




Volumn 73, Issue 3, 2001, Pages 612-619

Porous silicon as a versatile platform for laser desorption/ionization mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

EID: 0035253646     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac000746f     Document Type: Article
Times cited : (324)

References (44)
  • 9
    • 84994433304 scopus 로고    scopus 로고
    • Semiconductor Nanoclusters: Physical, Chemical, and Catalytic Aspects; Kamat, P. V, Meisel, D., Eds.; Elsevier Science: Amsterdam
    • (1997) , vol.103 , pp. 209
    • Sailor, M.J.1    Heinrich, J.L.2    Lauerhaas, J.M.3
  • 17
    • 0001929694 scopus 로고    scopus 로고
    • Properties of Porous Silicon; Canham, L., Ed.; INSPEC, The Institution of Electrical Engineers: London
    • (1997) , pp. 12-22
    • Halimaoui, A.1
  • 18
    • 0000538017 scopus 로고    scopus 로고
    • Properties of Porous Silicon; Canham, L. T., Ed.; The Institution of Electrical Engineers: London
    • (1997) , pp. 89-96
    • Hérino, R.1
  • 21
    • 0004140205 scopus 로고    scopus 로고
    • Properties of Porous Silicon; Canham, L. T., Ed.; The Institution of Electrical Engineers: London
    • (1997) , pp. 44-50
    • Canham, L.T.1
  • 22
    • 0003678641 scopus 로고    scopus 로고
    • Properties of Porous Silicon; Canham, L. T., Ed.; The Institution of Electrical Engineers: London
    • (1997) , pp. 154-157
    • Canham, L.T.1
  • 43
    • 0000503141 scopus 로고
    • Practical Surface Analysis, 2nd ed.; Briggs, D., Seah, M. P., Ed.; Wiley: Chichester, Chapter 5
    • (1990) , vol.1 , pp. 201
    • Seah, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.