Dependence of optical properties of vanadium oxide films on crystallization and temperature

Thin Solid Films

Volumn 520, Issue 6, 2012, Pages 2368-2371

  Kang, M I ^a   Kim, I K ^a   Oh, E J ^a   Kim, S W ^a   Ryu, J W ^b   Park, H Y ^c  

^a University of Ulsan   (South Korea)

^b Kongju National University   (South Korea)

^c Ulsan College   (South Korea)

Author keywords

Metal to insulator transition; Optical constants; Spectroscopic ellipsometry; Sputtering; Vanadium dioxide; Vanadium pentoxide

Indexed keywords

COMPLEX REFRACTIVE INDEX; CRYSTALLINE STRUCTURE; METAL-TO-INSULATOR TRANSITIONS; RADIO FREQUENCY SPUTTERING; VANADIUM DIOXIDE; VANADIUM OXIDE FILMS; VANADIUM PENTOXIDE;

METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; OPTICAL CONSTANTS; REFRACTIVE INDEX; SEMICONDUCTOR INSULATOR BOUNDARIES; SPECTROSCOPIC ELLIPSOMETRY; SPUTTERING; VANADIUM COMPOUNDS;

OXIDE FILMS;

EID: 84855916689     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.11.028     Document Type: Article

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