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Volumn 285, Issue 6, 2012, Pages 1215-1220
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The effect of copper concentration on structural, optical and dielectric properties of Cu xZn 1 - XS thin films
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Author keywords
Cu xZn 1 xS; Dielectric constant; Refractive index; SILAR
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Indexed keywords
AMBIENT PRESSURES;
COPPER CONCENTRATION;
DIELECTRIC CONSTANTS;
ENERGY BANDGAPS;
GLASS SUBSTRATES;
HIGH-FREQUENCY DIELECTRICS;
OPTICAL AND DIELECTRIC PROPERTIES;
POLYCRYSTALLINE;
ROOM TEMPERATURE;
S THIN FILMS;
SILAR;
SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;
ADSORPTION;
CONCENTRATION (PROCESS);
DIELECTRIC PROPERTIES;
ENERGY GAP;
GLASS;
REFRACTIVE INDEX;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
SURFACE PROPERTIES;
THIN FILMS;
X RAY DIFFRACTION;
ZINC;
COPPER;
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EID: 84855886650
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optcom.2011.10.062 Document Type: Article |
Times cited : (41)
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References (37)
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