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Volumn 285, Issue 6, 2012, Pages 1215-1220

The effect of copper concentration on structural, optical and dielectric properties of Cu xZn 1 - XS thin films

Author keywords

Cu xZn 1 xS; Dielectric constant; Refractive index; SILAR

Indexed keywords

AMBIENT PRESSURES; COPPER CONCENTRATION; DIELECTRIC CONSTANTS; ENERGY BANDGAPS; GLASS SUBSTRATES; HIGH-FREQUENCY DIELECTRICS; OPTICAL AND DIELECTRIC PROPERTIES; POLYCRYSTALLINE; ROOM TEMPERATURE; S THIN FILMS; SILAR; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;

EID: 84855886650     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2011.10.062     Document Type: Article
Times cited : (41)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.