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Volumn 284, Issue 9, 2011, Pages 2307-2311
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The relationship between refractive index-energy gap and the film thickness effect on the characteristic parameters of CdSe thin films
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Author keywords
CdSe; Dielectric constant; Effective mass; Film thickness; Refractive index; SILAR
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Indexed keywords
AMBIENT PRESSURES;
CDSE;
CDSE THIN FILMS;
CHARACTERISTIC PARAMETER;
DIELECTRIC CONSTANT;
EFFECTIVE MASS;
ELECTRON EFFECTIVE MASS;
ENERGY BANDGAPS;
GLASS SUBSTRATES;
HEXAGONAL STRUCTURES;
HIGH-FREQUENCY DIELECTRICS;
OPTICAL ABSORPTION STUDIES;
OPTICAL AND ELECTRICAL PROPERTIES;
POLYCRYSTALLINE;
ROOM TEMPERATURE;
SEM;
SILAR;
SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS;
THICKNESS EFFECT;
ADSORPTION;
CADMIUM ALLOYS;
CADMIUM COMPOUNDS;
ELECTRIC PROPERTIES;
ENERGY GAP;
FILM THICKNESS;
GLASS;
LIGHT REFRACTION;
ORGANIC POLYMERS;
REFRACTIVE INDEX;
REFRACTOMETERS;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
SURFACE PROPERTIES;
THIN FILMS;
X RAY DIFFRACTION;
OPTICAL FILMS;
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EID: 79951956526
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optcom.2010.12.094 Document Type: Article |
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Times cited : (133)
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References (25)
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