How the trapping of charges can explain the dielectric breakdown performance of alumina ceramics

Journal of the European Ceramic Society

Volumn 21, Issue 3, 2001, Pages 389-397

  Liebault, J ^a   Vallayer, J ^b   Goeuriot, D ^a   Treheux, D ^b   Thevenot, F ^a  

^a ECOLE DES MINES DE SAINT ETIENNE   (France)

^b ECOLE CENTRALE DE LYON   (France)

Author keywords

Al2O3; Dielectric breakdown; Dielectric properties; Impurities; Insulators

Indexed keywords

CERAMIC MATERIALS; CRYSTAL IMPURITIES; CRYSTAL MICROSTRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; DISPERSIONS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CHARGE; ELECTRIC CURRENTS; ELECTRIC INSULATING MATERIALS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); POLYCRYSTALLINE MATERIALS; RELAXATION PROCESSES; SINGLE CRYSTALS; SINTERING; ZIRCONIA;

DIELECTRIC BREAKDOWN;

ALUMINA;

ALUMINUM OXIDE; DIELECTRIC PROPERTY;

EID: 0035278263     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(00)00186-2     Document Type: Article

References (11)

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8. Space charge characterization for the 21th century
9. Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam
10. Charging effects under electron beam injection on sapphire implanted with Zirconium ions
11. Solubilities of magnesia, titania and magnesium titanate in aluminium oxide