Microstructural origin of the dielectric breakdown strength in alumina: A study by positron lifetime spectroscopy

Journal of the European Ceramic Society

Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2813-2816

  Si Ahmed, A ^a   Kansy, J ^a,b   Zarbout, K ^a   Moya, G ^a   Liebault, J ^c   Goeuriot D ^c  

^a AIX MARSEILLE UNIVERSITY   (France)

^b UNIVERSITY OF SILESIA   (Poland)

^c ECOLE DES MINES DE SAINT ETIENNE   (France)

Author keywords

Al2O3; Dielectric properties; Grain boundaries; Positron annihilation; Sintering

Indexed keywords

DISSOLUTION; ELECTRIC BREAKDOWN; GRAIN BOUNDARIES; MICROSTRUCTURE; SINGLE CRYSTALS; SINTERING; SOLUBILITY;

BREAKDOWN STRENGTH; CATIONIC VACANCY; DIELECTRIC BREAKDOWN; FOREIGN CATIONS;

ALUMINA;

MICROSTRUCTURE;

EID: 20444466480     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.146     Document Type: Article

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