Scaling and Evaluation of Carbon Nanotube Interconnects for VLSI Applications

Nano-Net 2007 - Proceedings of the 2nd International Conference on Nano-Networks

Volumn , Issue , 2007, Pages

  Chen, Fred ^a   Joshi, Ajay ^a   Stojanović, Vladimir ^a   Chandrakasan, Anantha ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Carbon nanotube; Interconnect; On chip networks; VLSI

Indexed keywords

COPPER; INTEGRATED CIRCUIT INTERCONNECTS; VLSI CIRCUITS;

CARBON NANOTUBE INTERCONNECTS; CRITICAL PROPERTIES; INTERCONNECT; INTERCONNECT TECHNOLOGY; INTERLAYER DIELECTRICS; NETWORK APPLICATIONS; ON-CHIP NETWORKS; SCALINGS; SYSTEM APPLICATIONS; VLSI;

CARBON NANOTUBES;

EID: 84855655977     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4108/ICST.NANONET2007.2041     Document Type: Conference Paper

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