Nanoscale density fluctuations in swift heavy ion irradiated amorphous SiO 2

Journal of Applied Physics

Volumn 110, Issue 12, 2011, Pages

  Kluth, P ^a   Pakarinen, O H ^b   Djurabekova, F ^b   Giulian, R ^a   Ridgway, M C ^a   Byrne, A P ^a   Nordlund, K ^b  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNIHILATION PROCESS; DENSITY FLUCTUATION; FLUENCES; HIGH-DENSITY REGIONS; ION TRACK; MOLECULAR DYNAMICS SIMULATIONS; NANO SCALE; SMALL ANGLE X-RAY SCATTERING; STEADY STATE; SWIFT HEAVY IONS;

MOLECULAR DYNAMICS; NANOTECHNOLOGY;

SILICON COMPOUNDS;

EID: 84855303499     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3671614     Document Type: Article

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