Equilibrium-thickness Amorphous Films on { 112̄0 } surfaces of Bi2O3-doped ZnO

Journal of the European Ceramic Society

Volumn 19, Issue 6-7, 1999, Pages 697-701

  Luo, Jian ^a   Chiang, Yet Ming ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Equilibrium thickness; Surfaces; ZnO

Indexed keywords

AMORPHOUS FILMS; BISMUTH COMPOUNDS; GRAIN BOUNDARIES; MATHEMATICAL MODELS; PHASE INTERFACES; TEMPERATURE; THERMODYNAMIC PROPERTIES; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; ZINC OXIDE;

EQUILIBRIUM THICKNESS; EUTECTIC TEMPERATURE;

PHASE EQUILIBRIA;

EID: 0032684923     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00299-4     Document Type: Article

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