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Volumn 55, Issue 9, 2007, Pages 3131-3142

Thin intergranular films and solid-state activated sintering in nickel-doped tungsten

Author keywords

Grain boundary diffusion; Grain boundary wetting; Interface segregation; Refractory metals; Sintering

Indexed keywords

DOPING (ADDITIVES); GRAIN BOUNDARIES; MATHEMATICAL MODELS; NICKEL; SINTERING; TUNGSTEN;

EID: 34247162392     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.01.017     Document Type: Article
Times cited : (218)

References (79)
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    • (1978) Processing of crystalline ceramics , pp. 151
    • Coble, R.L.1    Cannon, R.M.2
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    • Luo J, Qian H, Shi X. Interface stabilized nanometer-thick disordered films. In: Nalwa HS, editor. Encyclopedia of nanoscience and nanotechnology, 2nd ed. Velencia, CA: American Scientific Publishers [in press].
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    • Luo J. Stabilization of nanometer-thick quasi-liquid interfacial films: from ceramics to metals and beyond. In: Cook LP, Kaplan WD, editors. Materials science and technology 2006: fundamentals and characterization, vol. 2. Cincinnati, OH; 2006. p. 239.
  • 57
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    • Luo J, Chiang Y-M, Cannon RM. Inorganic nanoscale surficial films of self-selecting thickness. In: Nalwa HS, Ariga K, editors. Bottom-up nanofabrication: superamolecules, self-assemblies and organized films. Valencia, CA: American Scientific Publishers [in press].
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    • Cannon RM. Unpublished results; 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.